Title :
Bit Error Rate Estimation for Improving Jitter Testing of High-Speed Serial Links
Author :
Hong, Dongwoo ; Cheng, Kwang-Ting Tim
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
Abstract :
This paper describes a bit error rate (BER) estimation technique for high-speed serial links, which utilizes the jitter spectral information extracted from the transmitted data and some key characteristics of the clock and data recovery (CDR) circuit in the receiver. In addition to improving the accuracy of BER prediction, the estimation technique can be used to accelerate the jitter tolerance test by eliminating the conventional BER measurement process. Experimental results comparing the estimated BER and the BERT-measured BER on a 2.5 Gbps commercial CDR circuit demonstrate the high accuracy of the proposed technique
Keywords :
error statistics; estimation theory; integrated circuit testing; jitter; synchronisation; 2.4 Gbit/s; bit error rate estimation; clock and data recovery circuit; high speed serial links; jitter spectral information; jitter testing; Bit error rate; Circuit testing; Clocks; Data mining; Estimation error; Frequency; Jitter; Time measurement; Transfer functions; Transmitters;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297723