Title :
Negative tunneling time in frustrated thin film interferometers
Author :
Tournois, P. ; Laude, V.
Author_Institution :
Thomson-CSF Corporate Research Lab, Domaine de Corbeville
Keywords :
Interferometers; Laser excitation; Nonlinear optics; Optical distortion; Optical films; Optical materials; Stimulated emission; Transistors; Tunneling; Yttrium barium copper oxide;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4125-2
DOI :
10.1109/CLEO.1997.602347