Title :
A Survey of Test Problems and Solutions
Author_Institution :
Agilent Technol., Santa Clara, CA
Abstract :
The past two decades have seen a steady stream of challenges and responses in the test field. This paper surveys selected key problems and the progression of their solutions, in both topical and intrinsic aspects, with the aim of performing a meta-analysis of the nature of test innovation. The significant track record of success demonstrated by the industry will be put under serious pressure as technology advances
Keywords :
integrated circuit testing; meta analysis; surveys; test innovation; test problems; test solutions; Automatic test pattern generation; Automatic testing; Circuit testing; Commercialization; Data engineering; Design engineering; Design for testability; Electronic design automation and methodology; Electronic equipment testing; Technological innovation;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297738
