• DocumentCode
    3361456
  • Title

    The Role of ATPG Fault Diagnostics in Driving Physical Analysis

  • Author

    Nicholson, Roger ; Kardach, Cathy ; Cory, Bruce

  • Author_Institution
    Credence Syst. Corp., Milpitas, CA
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper presents the role that ATPG fault diagnostic tools can play in driving physical device analysis. Barriers exist between the logical fault diagnostic domain and the physical device analysis domain. These barriers are being removed through the application of software tools that use design place-and-route data to bridge the gap between logical and physical domains. A case study in the use of ATPG fault diagnostic data to drive a photon prober is presented which illustrates the value of this methodology. A natural collaboration presents itself in the use of ATPG fault diagnostic output to direct physical probing efforts
  • Keywords
    automatic test pattern generation; fault diagnosis; ATPG; fault diagnostics; physical device analysis; Application software; Automatic test pattern generation; Bridges; Collaboration; Failure analysis; Performance analysis; Probes; Software algorithms; Software tools; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297740
  • Filename
    4079418