DocumentCode
3361521
Title
Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment
Author
Gattiker, Anne ; Bhushan, Manjul ; Ketchen, Mark B.
Author_Institution
IBM Res. Div., Austin Res. Lab., TX
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
10
Abstract
A methodology based on canonical views is developed to facilitate rapid analysis of CMOS characterization and test data for product and process debug. The compressed representations aid in both quantitative and intuitive assimilation of the data, with a focus on model-to-hardware correlation and manufacturing variability
Keywords
CMOS integrated circuits; data analysis; design for manufacture; integrated circuit design; CMOS technology characterization; data analysis; manufacturing variability; model to hardware correlation; process debug; product debug; product impact assessment; CMOS process; CMOS technology; Circuit testing; Data analysis; MOSFETs; Manufacturing processes; Monitoring; Ring oscillators; Space technology; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297743
Filename
4079421
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