Title :
Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment
Author :
Gattiker, Anne ; Bhushan, Manjul ; Ketchen, Mark B.
Author_Institution :
IBM Res. Div., Austin Res. Lab., TX
Abstract :
A methodology based on canonical views is developed to facilitate rapid analysis of CMOS characterization and test data for product and process debug. The compressed representations aid in both quantitative and intuitive assimilation of the data, with a focus on model-to-hardware correlation and manufacturing variability
Keywords :
CMOS integrated circuits; data analysis; design for manufacture; integrated circuit design; CMOS technology characterization; data analysis; manufacturing variability; model to hardware correlation; process debug; product debug; product impact assessment; CMOS process; CMOS technology; Circuit testing; Data analysis; MOSFETs; Manufacturing processes; Monitoring; Ring oscillators; Space technology; Volume measurement;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297743
