• DocumentCode
    3361571
  • Title

    OCI: Open Compression Interface

  • Author

    Cory, Bruce ; Kapur, Rohit ; Tegethoff, Mick ; Kassab, Mark ; Keller, Brion ; Kim, Kee Sup ; Burek, Dwayne ; Oakland, Steve ; Nadeau-Dostie, Benoit

  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Before on-chip scan compression, it was possible to use different EDA tool vendors to do scan insertion, pattern generation, and diagnosis. On-chip scan compression changed that use model since each tool vendor supplied a different type of scan compression logic and had tool-specific ways to pass necessary information from scan insertion to pattern generation and from pattern generation to diagnosis. OCI (open compression interface) is a standardization of how the necessary data is passed from test logic insertion to pattern generation to diagnosis such that different vendors can be used for each step independent of the on-chip scan compression logic used. This document discusses the need for OCI and gives a conceptual overview of the OCI standard
  • Keywords
    integrated circuit testing; standardisation; system-on-chip; OCI; on chip scan compression; open compression interface; pattern generation; standardization; test logic insertion; Design for testability; Electronic design automation and methodology; Foundries; Logic design; Logic devices; Logic testing; Manufacturing; Power generation economics; Standardization; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297746
  • Filename
    4079424