Title :
Zero Defects Needs Third Party Software to Succeed
Author_Institution :
Pintail Technol., Piano, TX
Abstract :
The challenge of achieving zero defects cannot be achieved by semiconductor OEMs acting on their own. Semiconductor test needs to understand and embrace the role that third party vendors can play in overcoming such challenges
Keywords :
electronic engineering computing; integrated circuit reliability; integrated circuit testing; semiconductor test; third party software; zero defect mission; Computer industry; Electronic design automation and methodology; Electronics industry; Manufacturing industries; Outsourcing; Semiconductor device testing; Software maintenance; Software quality; Software testing; Software tools;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297757
