Title :
Zero Defects: Managing Variation & International In The Total Value Chain
Author :
Rijsinge, Robert
Author_Institution :
Bus. Unit Automotive & Identification, Philips Semicond., Nijmegen
Abstract :
Zero defects is a must-do. It can only be achieved by a much closer cooperation and combined effort between design, manufacturing and test. We need to look at the total value chain. It is reach by optimizing the design and process, by continues learning. (Advanced) screening is insufficient if we don´t learn and don´t implement the learning via design-for-test, -debug, and manufacturing methods
Keywords :
design for manufacture; design for testability; integrated circuit reliability; learning (artificial intelligence); advanced screening; continuous learning; design for debug; design for manufacturing; design for reliability; design for test; zero defects mission; Decision support systems;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297758
