Title :
HVM of High Speed I/O: We Need Many Options But Don´t Want to Use Them
Author_Institution :
NVIDIA, Santa Clara, CA
Abstract :
Most interfaces on graphics and chipset devices are now high speed. High quality testing of well characterized interfaces up to the 3.2Gbps range has not required high speed/loopback channel cards or special external/internal instruments. The next frontier that is coming rapidly is the 6+Gbps range. The big question is "what is needed to maintain quality and low test cost at these speeds"?
Keywords :
automatic test equipment; integrated circuit testing; production testing; 3.2 Gbit/s; automatic test equipment; chipset devices; graphics devices; high volume manufacturing; Costs; Foundries; Graphics; Instruments; Jitter; Logic design; Logic testing; Performance evaluation; Silicon; Transmitters;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297767
