DocumentCode
3361934
Title
HVM of High Speed I/O: We Need Many Options But Don´t Want to Use Them
Author
Cory, Bruce
Author_Institution
NVIDIA, Santa Clara, CA
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
1
Abstract
Most interfaces on graphics and chipset devices are now high speed. High quality testing of well characterized interfaces up to the 3.2Gbps range has not required high speed/loopback channel cards or special external/internal instruments. The next frontier that is coming rapidly is the 6+Gbps range. The big question is "what is needed to maintain quality and low test cost at these speeds"?
Keywords
automatic test equipment; integrated circuit testing; production testing; 3.2 Gbit/s; automatic test equipment; chipset devices; graphics devices; high volume manufacturing; Costs; Foundries; Graphics; Instruments; Jitter; Logic design; Logic testing; Performance evaluation; Silicon; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297767
Filename
4079445
Link To Document