• DocumentCode
    3361992
  • Title

    A new approach for shadow detection and compensation in color face images using within-class variance and effect evaluation

  • Author

    Tran Anh Tuan ; Chaudhry, Amita ; Jin Young Kim

  • Author_Institution
    Electron. & Eng. Dept., Chonnam Nat. Univ., Gwangju, South Korea
  • fYear
    2012
  • fDate
    12-15 Dec. 2012
  • Abstract
    Nowadays, face recognition systems make significant contributions to human modern life. But, under some specific cases such as deep and soft shadows, the system performance will be degraded and the result is no longer correct. So, in this paper, we propose a robust and highly effective approach to detect all shadow regions from a face image and to make the compensation without yielding any visual artifacts in a face image. In order to detect all shadows, we make the within-class variance relationship between the background (skin) and foreground (shadow) information and find the optimum point for shadow-skin separation. For shadow compensation, many effect evaluations are performed based some shadow characteristics and then they are used as input parameters for a compensation function to reduce the shadow effects. The experimental results on indoor and outdoor face images demonstrate that our algorithm can work robustly and accurately under different lighting variations.
  • Keywords
    face recognition; image colour analysis; object detection; skin; background information; color face images; deep shadows; effect evaluation; face recognition systems; foreground information; indoor face images; lighting variations; outdoor face images; shadow characteristics; shadow compensation; shadow detection; shadow-skin separation; soft shadows; within-class variance; Face; Image segmentation; Skin; Face recognition system; compensation function; deep and soft shadow; shadow compensation; shadow-skin separation; within-class variance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Information Technology (ISSPIT), 2012 IEEE International Symposium on
  • Conference_Location
    Ho Chi Minh City
  • Print_ISBN
    978-1-4673-5604-6
  • Type

    conf

  • DOI
    10.1109/ISSPIT.2012.6621283
  • Filename
    6621283