DocumentCode :
3362164
Title :
Wet chemical etching silicon wafer with low-reflection and super-hydrophobicity
Author :
Lai, Wuxing ; Wang, Xiaotao ; Shi, Tielin ; Zhang, Wei ; Tang, Zirong
Author_Institution :
Wuhan Nat. Lab. for Optoelectron., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear :
2011
fDate :
18-21 Oct. 2011
Firstpage :
486
Lastpage :
489
Abstract :
Successful etching silicon wafer for solar cells has been already prepared. In this work, wet chemical etching process at room temperature was introduced to fabricate large-area growth of Si nanowire (SiNW) arrays. The process was carried out on p-type (100) silicon wafer in aqueous HF+AgNO3 etching solution at room temperature. The wafer surface consisting of SiNW arrays shows the characteristics of low-reflection as low as less than 5% in the 450-790 nm wavelength range. The surface also exhibits super hydrophobicity with a high water contact angle up to 150°. Si wafers with large-area SiNW arrays on the surfaces displaying properties of low-reflection and super-hydrophobicity will have potential applications for fabricating high-efficiency and self-cleaning silicon solar cells.
Keywords :
contact angle; elemental semiconductors; etching; hydrophobicity; infrared spectra; nanofabrication; nanowires; reflection; semiconductor growth; silicon; visible spectra; Si; aqueous solution; infrared spectra; low reflection properties; optical properties; self-cleaning; silicon nanowire arrays; solar cells; superhydrophobicity; temperature 293 K to 298 K; water contact angle; wavelength 450 nm to 790 nm; wet chemical etching p-type (100) silicon wafer; Etching; Silicon; Surface morphology; Surface waves; Temperature; Water;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology Materials and Devices Conference (NMDC), 2011 IEEE
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-2139-7
Type :
conf
DOI :
10.1109/NMDC.2011.6155275
Filename :
6155275
Link To Document :
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