Title :
Physical aware design methodology for analog & mixed signal integrated circuits
Author :
Eissa, Haitham M. ; El-Rahman El-Mously, A.
Author_Institution :
Mentor graphics, Cairo, Egypt
Abstract :
Advanced layout parameters in the deep sub micron technologies impact the integrated circuit original design performance and change the schematics target specifications. Physical parameters such as stress effects and well proximity effects are more affecting analog and mixed signal designs in nanometer IC technologies. This paper presents a physical aware design methodology that enables analog and mixed signal designers to account for layout effects in their circuit design flow and to meet the circuit performance targets. Examples for analog designs using the proposed methodology are shown and future work in this area is proposed.
Keywords :
analogue integrated circuits; integrated circuit layout; mixed analogue-digital integrated circuits; proximity effect (lithography); stress effects; analog signal integrated circuits; circuit design flow; layout effects; mixed signal integrated circuits; physical aware design; stress effects; well proximity effects; Analog integrated circuits; Circuit optimization; Circuit synthesis; Design methodology; Integrated circuit layout; Integrated circuit technology; Mixed analog digital integrated circuits; Proximity effect; Signal design; Stress; Design Methodology; Physical Aware; Proximity effects; STI; Stress Effects; Well Proximity; eDFM;
Conference_Titel :
Design and Test Workshop (IDT), 2009 4th International
Conference_Location :
Riyadh
Print_ISBN :
978-1-4244-5748-9
DOI :
10.1109/IDT.2009.5404119