DocumentCode
3362280
Title
Physical aware design methodology for analog & mixed signal integrated circuits
Author
Eissa, Haitham M. ; El-Rahman El-Mously, A.
Author_Institution
Mentor graphics, Cairo, Egypt
fYear
2009
fDate
15-17 Nov. 2009
Firstpage
1
Lastpage
5
Abstract
Advanced layout parameters in the deep sub micron technologies impact the integrated circuit original design performance and change the schematics target specifications. Physical parameters such as stress effects and well proximity effects are more affecting analog and mixed signal designs in nanometer IC technologies. This paper presents a physical aware design methodology that enables analog and mixed signal designers to account for layout effects in their circuit design flow and to meet the circuit performance targets. Examples for analog designs using the proposed methodology are shown and future work in this area is proposed.
Keywords
analogue integrated circuits; integrated circuit layout; mixed analogue-digital integrated circuits; proximity effect (lithography); stress effects; analog signal integrated circuits; circuit design flow; layout effects; mixed signal integrated circuits; physical aware design; stress effects; well proximity effects; Analog integrated circuits; Circuit optimization; Circuit synthesis; Design methodology; Integrated circuit layout; Integrated circuit technology; Mixed analog digital integrated circuits; Proximity effect; Signal design; Stress; Design Methodology; Physical Aware; Proximity effects; STI; Stress Effects; Well Proximity; eDFM;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Test Workshop (IDT), 2009 4th International
Conference_Location
Riyadh
Print_ISBN
978-1-4244-5748-9
Type
conf
DOI
10.1109/IDT.2009.5404119
Filename
5404119
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