Title :
On Deratings to Refine System-Level Failure Rate Estimations
Author :
Smekens, C. ; Leveugle, R.
Author_Institution :
TIMA Lab., Grenoble
Abstract :
This work discusses refinements of the failure rate estimation of electronic systems subject to transients and soft errors. The reliability modeling is classically derived from the interconnection of components in the system and the system-level failure rate is computed on the basis of the elementary component failure rates. The refinement is based on deratings that take into account not only the detailed structural information but also the characteristics of the faults and the temporal properties of the system. The computations show that accurately evaluating the global failure rate of the system requires introducing the concept of "persistence window" that distinguishes permanent and transient faults. The impact of common modes and error propagations through interconnections is also studied.
Keywords :
integrated circuit interconnections; integrated circuit reliability; transient analysis; component interconnection; electronic systems; error propagations; permanent faults; persistence window; reliability modeling; soft errors; system-level failure rate estimations; transients errors; Aerospace electronics; Circuit faults; Integrated circuit interconnections; Laboratories; Logic; Power generation; Power system reliability; Power system restoration; Pulse generation; Space power stations;
Conference_Titel :
Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-1377-5
Electronic_ISBN :
978-1-4244-1378-2
DOI :
10.1109/ICECS.2007.4510996
