DocumentCode :
3362578
Title :
Mold compound fracture mode study for high reliability package
Author :
Lee, Bang-Wook ; Yu, F.
Author_Institution :
Texas Instrum. Taiwan Ltd., Taipei, Taiwan
fYear :
2013
fDate :
11-13 Dec. 2013
Firstpage :
189
Lastpage :
192
Abstract :
This paper presents TI development of high reliability molding compound material for power enhancement packages with PPF LDF. The mold gate remains due to good molding compound high adhesion and low flexural strength/Modulus are observed in several packages during mass production run. Correlations of adhesion and modulus change with Respect to its fracture strength under different conditions are studied. As a result, the gate remains solved by achieving the sweet spot based on material properties on optimized molding parameters. The gate remains on LDF side rail which will be stuck at T&F process. A modification to dies and LDF design can jump across the hurdle, but high investment needed. With this study, the gate remains can be conquered after an effective DOE with the proper understanding of Material (Mold compound) properties and Mold Machine´s capability.
Keywords :
design of experiments; electronics packaging; moulding; reliability; DOE; flexural strength; high reliability molding compound material; high reliability package; mass production; mold compound fracture mode study; molding compound high adhesion; power enhancement packages; Adhesives; Compounds; Cooling; Lead; Logic gates; Reliability; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-2832-3
Type :
conf
DOI :
10.1109/EPTC.2013.6745710
Filename :
6745710
Link To Document :
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