DocumentCode :
3362661
Title :
Design and Use of FR-4 CBCPW Lines In Test Fixtures for SMD Components
Author :
Pejcinovic, Branimir ; Ceperic, Vladimir ; Baric, Adrijan
Author_Institution :
Portland State Univ., Portland
fYear :
2007
fDate :
11-14 Dec. 2007
Firstpage :
375
Lastpage :
378
Abstract :
High frequency/speed designs still predominantly use microstrip lines on relatively cheap FR-4 substrates, despite their relatively poor high frequency performance. One good alternative is to use CBCPW lines (conductor backed co-planar waveguide). Compared to CBCPW, microstrip lines are more susceptible to interference (EMI) and can more easily generate interference themselves. We have designed a number of lines that are used as "fixtures" to access SMD components and report on their performance. Designs are improved through extensive electromagnetic simulations and potential pitfalls are identified. For the lower GHz range, up to 3 GHz, we also report on the modeling of passive SMD components - capacitors and resistors - where good agreement between measurement and simulation is observed. Finally, we report on use of TDR technique for measurement and modeling and how it compares with VNA-based measurements.
Keywords :
coplanar waveguides; microstrip lines; network synthesis; surface mount technology; FR-4 CBCPW lines; SMD components; TDR technique; VNA-based measurements; conductor backed coplanar waveguide; high frequency-speed designs; microstrip lines; Capacitors; Conductors; Electromagnetic interference; Electromagnetic measurements; Electromagnetic waveguides; Fixtures; Frequency; Microstrip; Resistors; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-1377-5
Electronic_ISBN :
978-1-4244-1378-2
Type :
conf
DOI :
10.1109/ICECS.2007.4511008
Filename :
4511008
Link To Document :
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