DocumentCode :
3362685
Title :
FCBM-a field-induced charged-board model for electrostatic discharges
Author :
Lin, Don L.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fYear :
1992
fDate :
4-9 Oct 1992
Firstpage :
1583
Abstract :
The author addresses a test method for the evaluation of electronic subassemblies against the threat of electrostatic discharge (ESD). He describes a field-induced charged-board model (FCBM) for the simulation of real-world ESD. An experiment is designed and used to observe and measure ESD current waveforms. An analytic theory is developed to describe important fundamental ESD processes. The application of the theory to the FCBM ESD predicts waveform characteristics in excellent agreement with the experiment. A recommendation for the specification of the ESD waveform is offered for inclusion in future ESD test standards for electronic subassemblies
Keywords :
electronic equipment testing; electrostatic discharge; ESD; ESD current waveforms; electronic subassemblies; electrostatic discharges; field-induced charged-board model; Biological system modeling; Circuit testing; Contacts; Electronic equipment testing; Electrostatic discharge; Humans; Integrated circuit packaging; Integrated circuit reliability; Pins; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Houston, TX
Print_ISBN :
0-7803-0635-X
Type :
conf
DOI :
10.1109/IAS.1992.244374
Filename :
244374
Link To Document :
بازگشت