• DocumentCode
    3362723
  • Title

    Scalable mean voting mechanism for fault tolerant analog circuits

  • Author

    Askari, S. ; Dwivedi, B. ; Saeed, A. ; Nourani, M.

  • Author_Institution
    Center for Integrated Circuits & Syst., Univ. of Texas at Dallas, Richardson, TX, USA
  • fYear
    2009
  • fDate
    15-17 Nov. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Redundancy techniques, such as N-tuple modular redundancy has been widely used to improve the reliability of digital circuits. Unfortunately nothing substantial has been done for the analog and mixed signal systems. In this paper, we propose a redundancy based fault-tolerant methodology to design a highly reliable analog systems. The key contribution of our work is an innovative analog mean voter. This mean voter is a low power, small area, very high bandwidth and linearly scalable voting circuit. Unlike digital voter which works with odd N in an NMR, for analog circuits the mean analog voter works for both odd and even N and hence reduces the area and power further. For the proof of concept, we designed two fault tolerant circuits i.e. a low pass anti-aliasing analog filter and a flash ADC. Experimental results are reported to verify the concepts and measure the system´s reliability when single upset transient may occur.
  • Keywords
    analogue circuits; analogue-digital conversion; circuit reliability; fault tolerance; low-pass filters; low-power electronics; network analysis; network synthesis; redundancy; transients; N-tuple modular redundancy; analog circuit reliability; analog mean voter; analog systems; analog-to-digital converter; fault tolerant analog circuits; flash ADC; linearly scalable mean voting circuit; low pass antialiasing analog filter; mixed signal systems; redundancy based fault-tolerant technique; single upset transients; Analog circuits; Bandwidth; Design methodology; Digital circuits; Fault tolerance; Fault tolerant systems; Nuclear magnetic resonance; Power system reliability; Redundancy; Voting; Fault-Tolerant Circuits; Mean Voter; N-Tuple Modular Redundancy; Reliability; Single-Upset Transient;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2009 4th International
  • Conference_Location
    Riyadh
  • Print_ISBN
    978-1-4244-5748-9
  • Type

    conf

  • DOI
    10.1109/IDT.2009.5404145
  • Filename
    5404145