DocumentCode
3362723
Title
Scalable mean voting mechanism for fault tolerant analog circuits
Author
Askari, S. ; Dwivedi, B. ; Saeed, A. ; Nourani, M.
Author_Institution
Center for Integrated Circuits & Syst., Univ. of Texas at Dallas, Richardson, TX, USA
fYear
2009
fDate
15-17 Nov. 2009
Firstpage
1
Lastpage
6
Abstract
Redundancy techniques, such as N-tuple modular redundancy has been widely used to improve the reliability of digital circuits. Unfortunately nothing substantial has been done for the analog and mixed signal systems. In this paper, we propose a redundancy based fault-tolerant methodology to design a highly reliable analog systems. The key contribution of our work is an innovative analog mean voter. This mean voter is a low power, small area, very high bandwidth and linearly scalable voting circuit. Unlike digital voter which works with odd N in an NMR, for analog circuits the mean analog voter works for both odd and even N and hence reduces the area and power further. For the proof of concept, we designed two fault tolerant circuits i.e. a low pass anti-aliasing analog filter and a flash ADC. Experimental results are reported to verify the concepts and measure the system´s reliability when single upset transient may occur.
Keywords
analogue circuits; analogue-digital conversion; circuit reliability; fault tolerance; low-pass filters; low-power electronics; network analysis; network synthesis; redundancy; transients; N-tuple modular redundancy; analog circuit reliability; analog mean voter; analog systems; analog-to-digital converter; fault tolerant analog circuits; flash ADC; linearly scalable mean voting circuit; low pass antialiasing analog filter; mixed signal systems; redundancy based fault-tolerant technique; single upset transients; Analog circuits; Bandwidth; Design methodology; Digital circuits; Fault tolerance; Fault tolerant systems; Nuclear magnetic resonance; Power system reliability; Redundancy; Voting; Fault-Tolerant Circuits; Mean Voter; N-Tuple Modular Redundancy; Reliability; Single-Upset Transient;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Test Workshop (IDT), 2009 4th International
Conference_Location
Riyadh
Print_ISBN
978-1-4244-5748-9
Type
conf
DOI
10.1109/IDT.2009.5404145
Filename
5404145
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