• DocumentCode
    3362940
  • Title

    A new approach for sensing and measuring the incident radiation on semiconductor mercury-cadmium-telluride (MCT) detector

  • Author

    Atti, Muhammad Taher Abuelma

  • Author_Institution
    King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
  • fYear
    2009
  • fDate
    15-17 Nov. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper a new circuit for sensing and measuring the incident radiation on a constant-voltage biased infrared semiconductor mercury-cadmium-telluride (MCT) detector is presented. The circuit is built around the current-feedback operational amplifier (CFOA). Moreover, a mathematical model for the relationship between the output voltage and incident radiation is obtained. The model, basically a sine-series function, can easily yield closed-form expressions for the harmonic and intermodulation performance of the constant-voltage biased MCT detector with large-amplitude multisinusoidal incident radiation. The special case of two-tone equal-amplitude incident radiation is considered in detail. The results show that the second-order harmonic and intermodulation products are always higher than the third-order components. Moreover, the results show that the second-order intermodulation is always dominant. Furthermore, a comparison with the harmonic and intermodulation performance of constant-current biased MCT detectors is presented. This comparison clearly shows that the nonlinear performance of the constant voltage-biased and the constant current-biased MCT is exactly the same. Thus, in terms of the nonlinear performance, both constant voltage- and constant current-biased MCT detectors are identical. This implies that the previously reported improvement in the nonlinear performance of the constant voltage-biased MCT detector is attributed to the use of proper feedback in the biasing/preamplifier circuit.
  • Keywords
    cadmium alloys; mathematical analysis; mercury alloys; operational amplifiers; preamplifiers; semiconductor devices; biasing-preamplifier circuit; current-feedback operational amplifier; harmonic-intermodulation performance; incident radiation; infrared semiconductor mercury-cadmium-telluride; mathematical model; second-order harmonic; semiconductor mercury-cadmium-telluride detector; sine-series function; Closed-form solution; Feedback circuits; Infrared detectors; Mathematical model; Operational amplifiers; Preamplifiers; Radiation detector circuits; Radiation detectors; Semiconductor radiation detectors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2009 4th International
  • Conference_Location
    Riyadh
  • Print_ISBN
    978-1-4244-5748-9
  • Type

    conf

  • DOI
    10.1109/IDT.2009.5404157
  • Filename
    5404157