Title :
2007 IEEE International Conference on Integrated Circuit Design and Technology
fDate :
May 30 2007-June 1 2007
Abstract :
The following topics are dealt with: integrated circuit design technology; computer aided design; low power device technologies; advanced transistors; system on a chip; FinFET device technology; and integrated high-voltage LDMOS transistors reliability.
Keywords :
CAD; MOSFET; integrated circuit design; integrated circuit technology; low-power electronics; semiconductor device reliability; system-on-chip; FinFET device technology; LDMOS transistors reliability; advanced transistors; computer aided design; integrated circuit design; low power device technologies; system on a chip;
Conference_Titel :
Integrated Circuit Design and Technology, 2007. ICICDT '07. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
1-4244-0757-5
Electronic_ISBN :
1-4244-0757-5
DOI :
10.1109/ICICDT.2007.4299521
