DocumentCode
336312
Title
Estimation of depth of anesthesia using the midlatency auditory evoked potentials by means of neural network based multiple classifier system
Author
Lu, Ying-Ying ; Huang, Johnnie W. ; Roy, Rob J.
Author_Institution
Dept. of Biomed. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume
3
fYear
1997
fDate
30 Oct-2 Nov 1997
Firstpage
1100
Abstract
This paper proposes a neural network based multiple classifier system (MCS) for monitoring the depth of anesthesia by assessing the characteristics of the middle latency auditory potentials (MLAEP) and the Propofol effect-site concentration. The system is composed of three individual neural network based classifiers with different sets of features. Discrete wavelet transformation (DTWT) and power spectrum estimation (PSD) were utilized to extract the MLAEP features. A Bayesian combination rule was then applied to evaluate the final decision by combining the results of the three individual classifiers. From total of 113 data samples only one was incorrectly classified and the misclassified sample belonged to a positive response. The system achieved a 99% accuracy rate for classifying anesthesia depth
Keywords
Bayes methods; auditory evoked potentials; backpropagation; discrete wavelet transforms; feedforward neural nets; medical expert systems; medical signal processing; multilayer perceptrons; patient monitoring; pattern classification; spectral analysis; surgery; Bayesian combination rule; Propofol effect-site concentration; anesthesia monitoring; backpropagation; depth of anesthesia; discrete wavelet transformation; feature extraction; midlatency auditory evoked potentials; neural network based multiple classifier system; power spectrum estimation; Anesthesia; Artificial neural networks; Bayesian methods; Clamps; Data mining; Delay; Discrete wavelet transforms; Feature extraction; Neural networks; Spectral analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1094-687X
Print_ISBN
0-7803-4262-3
Type
conf
DOI
10.1109/IEMBS.1997.756543
Filename
756543
Link To Document