DocumentCode :
3363134
Title :
On optical phase shift profilometry based on dual tree complex wavelet transform
Author :
Hsung, Tai-Chiu ; Lun, Daniel Pak-Kong
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Hong Kong, China
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
337
Lastpage :
340
Abstract :
In optical phase shift profilometry, parallel fringe patterns are projected onto an object and the deformed fringes are captured using a digital camera. It is of particular interest because it enables reconstruction of the 3D shape of the object using just a few image captures, which facilitates real time applications. However, when using the approach in real life environment, it is noticed that the noise in the captured images can greatly affect the reconstruction quality. In this paper, we firstly analyze why the noisy fringe images can best be analyzed using the oriented 2D dual tree complex wavelet transform. We then suggest an effective yet simple method for enhancing the noisy fringe images. Both the simulation and experiment results show that the new approach can give good performance in reconstruction with fringe images even at high noise level.
Keywords :
cameras; image reconstruction; trees (mathematics); wavelet transforms; 3D shape reconstruction quality; digital camera; noisy fringe images; optical phase shift profilometry; oriented 2D dual tree complex wavelet transform; parallel fringe patterns; Image reconstruction; Noise; Noise measurement; Solid modeling; Wavelet coefficients; Dual tree complex wavelet transform; phase unwrapping; profilometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5653341
Filename :
5653341
Link To Document :
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