• DocumentCode
    3363159
  • Title

    The research of temperature compensation technology of high-temperature pressure sensor

  • Author

    Cui Chun Sheng ; Ma Tie Hua

  • Author_Institution
    Key Lab. of Instrum. Sci. & Dynamic Meas., North Univ. of China, Taiyuan, China
  • Volume
    5
  • fYear
    2011
  • fDate
    12-14 Aug. 2011
  • Firstpage
    2267
  • Lastpage
    2270
  • Abstract
    Silicon piezoresistive pressure sensor is a kind of sensor with excellent performance, wide range of applications. But its sensitive components make itself vulnerable to temperature, only by solving the problem of temperature compensation can improve the accuracy, stability and other important performance. The high temperature and high pressure silicon pressure sensor actual operating temperature range is (- 55°C ~ + 175°C); its hardware compensated temperature range is (+ 25°C ~ + 80°C) which is narrower than its actual operating temperature range, zero drift maximum reach 0.65%FS/10°C. These can not reach the using requirement. This article has analyzed the experimental data of this pressure sensor in the full operating temperature range. According to the characteristics of different temperature interval, the method of software compensation has been used to reduce zero temperature drift rate by an order of magnitude. Experiments prove that the piecewise polynomial fitting method which this article uses has good effect, and good applicability in compensating zero-point temperature drift and the original sensor unbalance, worth extending.
  • Keywords
    compensation; elemental semiconductors; piecewise polynomial techniques; piezoresistive devices; pressure sensors; silicon; temperature sensors; Si; high-temperature pressure sensor; piecewise polynomial fitting method; piezoresistive pressure sensor; sensor unbalance; software compensation; temperature -55 degC to 175 degC; temperature 25 degC to 80 degC; temperature compensation technology; temperature interval; zero-point temperature drift rate; Accuracy; Fitting; Piezoresistance; Polynomials; Temperature distribution; Temperature sensors; high accuracy; high-temperature pressure sensor; temperature compensation; temperature drift; wheatstone bridge; zero maladjustment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
  • Conference_Location
    Harbin, Heilongjiang, China
  • Print_ISBN
    978-1-61284-087-1
  • Type

    conf

  • DOI
    10.1109/EMEIT.2011.6023563
  • Filename
    6023563