Title :
The research of temperature compensation technology of high-temperature pressure sensor
Author :
Cui Chun Sheng ; Ma Tie Hua
Author_Institution :
Key Lab. of Instrum. Sci. & Dynamic Meas., North Univ. of China, Taiyuan, China
Abstract :
Silicon piezoresistive pressure sensor is a kind of sensor with excellent performance, wide range of applications. But its sensitive components make itself vulnerable to temperature, only by solving the problem of temperature compensation can improve the accuracy, stability and other important performance. The high temperature and high pressure silicon pressure sensor actual operating temperature range is (- 55°C ~ + 175°C); its hardware compensated temperature range is (+ 25°C ~ + 80°C) which is narrower than its actual operating temperature range, zero drift maximum reach 0.65%FS/10°C. These can not reach the using requirement. This article has analyzed the experimental data of this pressure sensor in the full operating temperature range. According to the characteristics of different temperature interval, the method of software compensation has been used to reduce zero temperature drift rate by an order of magnitude. Experiments prove that the piecewise polynomial fitting method which this article uses has good effect, and good applicability in compensating zero-point temperature drift and the original sensor unbalance, worth extending.
Keywords :
compensation; elemental semiconductors; piecewise polynomial techniques; piezoresistive devices; pressure sensors; silicon; temperature sensors; Si; high-temperature pressure sensor; piecewise polynomial fitting method; piezoresistive pressure sensor; sensor unbalance; software compensation; temperature -55 degC to 175 degC; temperature 25 degC to 80 degC; temperature compensation technology; temperature interval; zero-point temperature drift rate; Accuracy; Fitting; Piezoresistance; Polynomials; Temperature distribution; Temperature sensors; high accuracy; high-temperature pressure sensor; temperature compensation; temperature drift; wheatstone bridge; zero maladjustment;
Conference_Titel :
Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
Conference_Location :
Harbin, Heilongjiang, China
Print_ISBN :
978-1-61284-087-1
DOI :
10.1109/EMEIT.2011.6023563