DocumentCode :
3363287
Title :
Investigation of a microchannel-based cooling interposer for high-performance memory-on-logic 3DIC design
Author :
Melamed, Samson ; Hashino, Masaru ; Kato, Fumiki ; Nemoto, Shunsuke ; Bui, T.T. ; Kikuchi, Kazuro ; Nakagawa, Hirotoshi ; Aoyagi, Masahiro
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear :
2013
fDate :
11-13 Dec. 2013
Firstpage :
358
Lastpage :
362
Abstract :
3D integrated circuits (3DICs) stack wafers vertically, allowing for heterogeneous integration with shortened wirelengths between multiple circuits. In memory-on-Iogic systems there is a significant concern that high-power sections of the processor will create large thermal gradients that cause logical failures in the stacked memory. In this paper we investigate the use of a microchannel-based interposer to cool the microprocessor while simultaneously decreasing the thermal gradient that the processor imposes on the memory. We have found that hotspots are relatively insensitive to design parameters when the processor die is 300 μm thick, however at a thickness of 10 μm the hotspot temperatures are highly dependent on the microchannel sizing and the thickness of the SiNR polymer layer that was used to seal the microchannels and bond the wafers.
Keywords :
integrated circuit design; three-dimensional integrated circuits; 3D integrated circuits stack wafers; SiNR polymer layer; heterogeneous integration; high-performance memory-on-logic 3DIC design; high-power sections; hotspot temperatures; logical failures; microchannel sizing; microchannel thickness; microchannel-based cooling interposer; microchannels; microprocessor; shortened wirelengths; size 10 mum; size 300 mum; stacked memory; thermal gradients; Bonding; Heating; Interference; Microchannel; Microprocessors; Signal to noise ratio; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-2832-3
Type :
conf
DOI :
10.1109/EPTC.2013.6745742
Filename :
6745742
Link To Document :
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