• DocumentCode
    3363287
  • Title

    Investigation of a microchannel-based cooling interposer for high-performance memory-on-logic 3DIC design

  • Author

    Melamed, Samson ; Hashino, Masaru ; Kato, Fumiki ; Nemoto, Shunsuke ; Bui, T.T. ; Kikuchi, Kazuro ; Nakagawa, Hirotoshi ; Aoyagi, Masahiro

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
  • fYear
    2013
  • fDate
    11-13 Dec. 2013
  • Firstpage
    358
  • Lastpage
    362
  • Abstract
    3D integrated circuits (3DICs) stack wafers vertically, allowing for heterogeneous integration with shortened wirelengths between multiple circuits. In memory-on-Iogic systems there is a significant concern that high-power sections of the processor will create large thermal gradients that cause logical failures in the stacked memory. In this paper we investigate the use of a microchannel-based interposer to cool the microprocessor while simultaneously decreasing the thermal gradient that the processor imposes on the memory. We have found that hotspots are relatively insensitive to design parameters when the processor die is 300 μm thick, however at a thickness of 10 μm the hotspot temperatures are highly dependent on the microchannel sizing and the thickness of the SiNR polymer layer that was used to seal the microchannels and bond the wafers.
  • Keywords
    integrated circuit design; three-dimensional integrated circuits; 3D integrated circuits stack wafers; SiNR polymer layer; heterogeneous integration; high-performance memory-on-logic 3DIC design; high-power sections; hotspot temperatures; logical failures; microchannel sizing; microchannel thickness; microchannel-based cooling interposer; microchannels; microprocessor; shortened wirelengths; size 10 mum; size 300 mum; stacked memory; thermal gradients; Bonding; Heating; Interference; Microchannel; Microprocessors; Signal to noise ratio; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-2832-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2013.6745742
  • Filename
    6745742