• DocumentCode
    3363390
  • Title

    Switching characteristics of MCT in resonant DC link soft-switching power converters

  • Author

    Pathomkasikul, Worapanya ; Zinger, Donald S. ; Elbuluk, Malik E. ; Xu, Longa

  • Author_Institution
    Dept. of Electr. Eng., Akron Univ., OH, USA
  • fYear
    1992
  • fDate
    4-9 Oct 1992
  • Firstpage
    1173
  • Abstract
    Simulations and experiments were performed using a MOS-controlled thyristor (MCT) in both zero voltage switching and zero current switching resonant power converters. A computer model was used to simulate the turn-on and turn-off dynamics of the MCT device in the resonant DC link (RDCL) voltage and current source converters, and the performances were compared. A laboratory experiment was designed and constructed to test the switching behavior of the MCT in two different RDCL topologies. The experimental results are presented and compared to those from the simulation. It was shown that the MCT device would perform well in either type of circuit. For the simple circuits tested, both simulations and experiments showed higher losses in the zero current switching. For more practical circuits it is believed that these losses would be more equal
  • Keywords
    digital simulation; electronic engineering computing; metal-insulator-semiconductor devices; power convertors; semiconductor device models; semiconductor device testing; semiconductor switches; switching circuits; thyristor applications; thyristors; MOS-controlled thyristor; digital simulation; laboratory experiment; losses; performance; power converters; resonant DC link; semiconductor switches; soft switching; testing; turn-off; turn-on; zero current switching; zero voltage switching; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; MOSFETs; Resonance; Switching converters; Thyristors; Zero current switching; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1992., Conference Record of the 1992 IEEE
  • Conference_Location
    Houston, TX
  • Print_ISBN
    0-7803-0635-X
  • Type

    conf

  • DOI
    10.1109/IAS.1992.244413
  • Filename
    244413