Title :
Wafer reconstruction: An alternative 3D integration process flow
Author :
Teng Wang ; Silva, J.L. ; Daily, R. ; Capuz, G. ; Gonzalez, M. ; June Rebibis, Kenneth ; Kroehnert, Steffen ; Beyne, Eric
Author_Institution :
imec, Leuven, Belgium
Abstract :
Wafer reconstruction is a process of forming an integral handle-able wafer by filling the gaps between the dies after die-to-wafer assembly to allow for further processing on the landing wafer, e.g. thinning, redistribution layer deposition, and bumping. This paper examines key aspects and challenges of different wafer reconstruction process flows. Based on analytical and finite element method modeling, guidelines for material selection and structural design are generated. One selected process flow is successfully demonstrated in a typical 300 mm eWLB production environment, proving the feasibility of wafer reconstruction as a 3D integration process flow.
Keywords :
finite element analysis; integrated circuit packaging; three-dimensional integrated circuits; 3D integration process flow; bumping; die-to-wafer assembly; eWLB production environment; finite element method modeling; integral handle-able wafer; material selection; redistribution layer deposition; size 300 mm; structural design; wafer reconstruction process flows; Analytical models; Electromagnetic compatibility; Finite element analysis; Semiconductor device modeling; Silicon; Three-dimensional displays;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-2832-3
DOI :
10.1109/EPTC.2013.6745754