Title :
An efficient interconnect test using BIST module in a boundary-scan environment
Author :
Kim, Hyun Jin ; Shin, Jongchul ; Kang, Sungho
Author_Institution :
Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
In this paper, an efficient built-in self-test (BIST) method for applying tests is developed without collisions of the test data in three-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and a BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility
Keywords :
built-in self test; circuit analysis computing; integrated circuit interconnections; subroutines; 3-state nets; BIST module; boundary-scan environment; built-in self-test; flexibility; interconnect test algorithm; multiple boundary scan chains; net configurations; test data collisions; Bidirectional control; Built-in self-test; Controllability; Drives; Fault detection; Legged locomotion; Logic testing; Observability; System testing; Wiring;
Conference_Titel :
Computer Design, 1999. (ICCD '99) International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-0406-X
DOI :
10.1109/ICCD.1999.808562
