Title :
On-line BIST for testing analog circuits
Author :
Velasco-Medina, J. ; Rayane, I. ; Nicolaidis, M.
Author_Institution :
Reliable Integrated Syst. Group, TIMA/INPG, Grenoble, France
Abstract :
In this paper, we present a new online built-in self-test (BIST) approach for testing analog circuits. It uses a current window comparator and current-based checker circuits for processing the test response of the analog parts in mixed-signal integrated circuits. Online analog BIST capability is achieved by using high-speed current-mode circuits. A leapfrog filter has been considered as a test vehicle, and simulation results show the feasibility and effectiveness of the proposed BIST approach
Keywords :
analogue circuits; built-in self test; circuit simulation; circuit testing; current-mode circuits; online operation; BIST; analogue circuit testing; current window comparator; current-based checker circuits; high-speed current-mode circuits; leapfrog filter; mixed-signal integrated circuits; online built-in self-test; simulation; test response processing; Analog circuits; Automatic testing; Built-in self-test; Circuit simulation; Circuit testing; Current mode circuits; Filters; Integrated circuit testing; Mixed analog digital integrated circuits; Vehicles;
Conference_Titel :
Computer Design, 1999. (ICCD '99) International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-0406-X
DOI :
10.1109/ICCD.1999.808563
