DocumentCode
3363655
Title
SAR mapping technology and its application in difficulty terrain area
Author
Zhang, Jixian ; Yang, Shucheng ; Zhao, Zheng ; Huang, Guoman
Author_Institution
Chinese Acad. of Surveying & Mapping, Beijing, China
fYear
2010
fDate
25-30 July 2010
Firstpage
3608
Lastpage
3611
Abstract
In western China, there is a large area perennially covered by cloud, fog, ice, and snow. It is very difficult to acquire optical image for mapping in this area, so high resolution spaceborne synthetic aperture radar (SAR) images have to be used to make topographic maps. A scheme of SAR mapping technology is proposed in this paper. Digital elevation model (DEM) was extracted with stereo radargrammetry (StereoSAR), and topographic map was created with ideal SAR stereoscopic image pairs. Due to the difficult terrain, parallax edit under stereoscopic observation is used for improving matching result from stereo images. Ideal SAR stereoscopic image pairs generated with image simulation based on DEM are used for stereoscopic observation to extract topographic features. Ascending and descending image data were combined to solve the problem of lack of information caused by shadow and layover. Mapping experiment in western China shows that SAR data with resolution of 3-8 meters can be used to make topographic map at scale of 1:50,000 by the scheme of SAR mapping introduced in this paper.
Keywords
image matching; radar imaging; stereo image processing; synthetic aperture radar; terrain mapping; topography (Earth); SAR mapping technology; SAR stereoscopic image; StereoSAR; digital elevation model; high resolution spaceborne synthetic aperture radar; optical image; stereo image matching; stereo radargrammetry; terrain area; topographic map; Adaptive optics; Feature extraction; Image resolution; Optical imaging; Orbits; Synthetic aperture radar; DEM; StereoSAR; ascending and descending; parallax edit; topographic map;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location
Honolulu, HI
ISSN
2153-6996
Print_ISBN
978-1-4244-9565-8
Electronic_ISBN
2153-6996
Type
conf
DOI
10.1109/IGARSS.2010.5653374
Filename
5653374
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