• DocumentCode
    336375
  • Title

    Two EEG derived parameters for the measurement of the effects caused by propofol on sedation

  • Author

    Ramnirez, N. ; Lugo, Gustavo ; Medina, Veronica

  • Author_Institution
    Dept. de Ingenieria Electr., Univ. Autonoma Metropolitana, Mexico City, Mexico
  • Volume
    3
  • fYear
    1997
  • fDate
    30 Oct-2 Nov 1997
  • Firstpage
    1207
  • Abstract
    Two parameters to measure propofol´s sedation effect on the EEG signal are presented. One parameter is based on a wavelet multiresolution decomposition that allows spectral analysis on each detail. The other parameter is based on cross spectrum analysis that underlines similar frequency phenomena that appear in two different EEG epochs. Both parameters were compared with the spectral edge that has been widely used to measure anesthetic induced changes on the EEG. The two parameters could be described as a sigmoidal concentration-response relationship in all real EEG signals. The results suggest that these parameters can be useful for propofol sedation monitoring, pharmacodynamical modeling and closed-loop propofol sedation control systems
  • Keywords
    drug delivery systems; electroencephalography; medical signal processing; patient monitoring; signal resolution; spectral analysis; surgery; wavelet transforms; CNS depression; EEG derived parameters; EEG epochs; anesthetic induced changes; closed-loop sedation control systems; cross spectrum analysis; pharmacodynamical modeling; power spectral density; propofol effects; sedation monitoring; sigmoidal concentration-response relationship; similar frequency phenomena; spectral analysis; spectral edge; spline function; wavelet multiresolution decomposition; Anesthesia; Anesthetic drugs; Electrodes; Electroencephalography; Frequency; Hospitals; Signal processing; Signal resolution; Spectral analysis; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-4262-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.1997.756889
  • Filename
    756889