DocumentCode
3363771
Title
On detecting bridges causing timing failures
Author
Mandava, Sreenivas ; Chakravarty, Sreejit ; Kundu, Sandip
Author_Institution
Microprocessor Products Group, Intel Corp., Santa Clara, CA, USA
fYear
1999
fDate
1999
Firstpage
400
Lastpage
406
Abstract
High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at detecting such defects. The following results, pertinent to resolving the above issue, are presented: mechanisms by which bridges cause speed failure; identification of non-classical transition tests for such bridges; and the usefulness and pitfalls of using low voltage testing to detect such bridges
Keywords
bridge circuits; circuit simulation; circuit testing; bridge detection; high resistance bridges; low voltage testing; non-classical transition tests; resistive bridges; speed failures; timing failures; Analytical models; Bridge circuits; Computational modeling; Degradation; Delay; Logic testing; Low voltage; Microprocessors; SPICE; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design, 1999. (ICCD '99) International Conference on
Conference_Location
Austin, TX
ISSN
1063-6404
Print_ISBN
0-7695-0406-X
Type
conf
DOI
10.1109/ICCD.1999.808573
Filename
808573
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