• DocumentCode
    3363771
  • Title

    On detecting bridges causing timing failures

  • Author

    Mandava, Sreenivas ; Chakravarty, Sreejit ; Kundu, Sandip

  • Author_Institution
    Microprocessor Products Group, Intel Corp., Santa Clara, CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    400
  • Lastpage
    406
  • Abstract
    High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at detecting such defects. The following results, pertinent to resolving the above issue, are presented: mechanisms by which bridges cause speed failure; identification of non-classical transition tests for such bridges; and the usefulness and pitfalls of using low voltage testing to detect such bridges
  • Keywords
    bridge circuits; circuit simulation; circuit testing; bridge detection; high resistance bridges; low voltage testing; non-classical transition tests; resistive bridges; speed failures; timing failures; Analytical models; Bridge circuits; Computational modeling; Degradation; Delay; Logic testing; Low voltage; Microprocessors; SPICE; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 1999. (ICCD '99) International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-0406-X
  • Type

    conf

  • DOI
    10.1109/ICCD.1999.808573
  • Filename
    808573