• DocumentCode
    3363861
  • Title

    Physics based fatigue compact model for ferroelectric capacitors

  • Author

    Gondro, Elmar ; Kühn, Christian ; Schuler, Franz ; Kowarik, Oskar

  • Author_Institution
    Inst. of Electron., Univ. der Bundeswehr Munchen, Neubiberg, Germany
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    615
  • Abstract
    A physics based compact model describing the fatigue behavior of ferroelectric capacitors has been developed. Fatigue is a gradual decrease of detectable polarization with increasing number of polarization cycles. This can be caused by trapped charges which pin dipoles near the interface to the electrode. In order to polarize those pinned dipoles they have to be separated from the trapped charges by a higher electrical force. This force has been described in our model by additional coercive voltages representing the different polarization response of the dipoles in the interface region in contrast to those in the inner region of the ferroelectric capacitor. Our model has been implemented into a common-used circuit simulator showing good agreement with measurements
  • Keywords
    capacitance; circuit simulation; dielectric hysteresis; dielectric polarisation; ferroelectric capacitors; ferroelectric storage; FRAM cells; circuit simulator; coercive voltages; detectable polarization; electrical force; fatigue behavior; fatigue capacitance characteristic; ferroelectric capacitors; hysteresis loop; interface region; physics based compact model; pinned dipole polarization; polarization cycles; polarization response; trapped charges; Capacitors; Circuits; Electrodes; Fatigue; Ferroelectric materials; Hysteresis; Physics; Polarization; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.942396
  • Filename
    942396