DocumentCode
3363861
Title
Physics based fatigue compact model for ferroelectric capacitors
Author
Gondro, Elmar ; Kühn, Christian ; Schuler, Franz ; Kowarik, Oskar
Author_Institution
Inst. of Electron., Univ. der Bundeswehr Munchen, Neubiberg, Germany
Volume
2
fYear
2000
fDate
2000
Firstpage
615
Abstract
A physics based compact model describing the fatigue behavior of ferroelectric capacitors has been developed. Fatigue is a gradual decrease of detectable polarization with increasing number of polarization cycles. This can be caused by trapped charges which pin dipoles near the interface to the electrode. In order to polarize those pinned dipoles they have to be separated from the trapped charges by a higher electrical force. This force has been described in our model by additional coercive voltages representing the different polarization response of the dipoles in the interface region in contrast to those in the inner region of the ferroelectric capacitor. Our model has been implemented into a common-used circuit simulator showing good agreement with measurements
Keywords
capacitance; circuit simulation; dielectric hysteresis; dielectric polarisation; ferroelectric capacitors; ferroelectric storage; FRAM cells; circuit simulator; coercive voltages; detectable polarization; electrical force; fatigue behavior; fatigue capacitance characteristic; ferroelectric capacitors; hysteresis loop; interface region; physics based compact model; pinned dipole polarization; polarization cycles; polarization response; trapped charges; Capacitors; Circuits; Electrodes; Fatigue; Ferroelectric materials; Hysteresis; Physics; Polarization; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location
Honolulu, HI
ISSN
1099-4734
Print_ISBN
0-7803-5940-2
Type
conf
DOI
10.1109/ISAF.2000.942396
Filename
942396
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