• DocumentCode
    3363989
  • Title

    Design Asynchronous Circuits for Soft Error Tolerance

  • Author

    Kuang, Weidong ; Xiao, Enjun ; Ibarra, Casto Manuel ; Zhao, Peiyi

  • Author_Institution
    Univ. of Texas-Pan American, Edinburg
  • fYear
    2007
  • fDate
    May 30 2007-June 1 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents a quasi delay insensitive (QDI) asynchronous circuit design paradigm -modified Null Convention Logic (NCL), for high single event upset (SEU) tolerance We investigate the behavior of the QDI circuit in the presence of SEUs, and propose a framework to evaluate the SEU sensitivity of the circuit. The modified NCL circuit can eliminate all SEUs in computational blocks if these SEUs occur when the computational blocks are in steady sates. Finally we present a case study of a two-bit adder.
  • Keywords
    adders; asynchronous circuits; delay circuits; logic design; tolerance analysis; NCL; QDI; asynchronous circuit design; computational blocks; modified null convention logic; quasi delay insensitive circuit; single event upset tolerance; soft error tolerance; two-bit adder; Asynchronous circuits; Circuit faults; Delay; Hysteresis; Logic circuits; Pipelines; Registers; Single event upset; Timing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology, 2007. ICICDT '07. IEEE International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    1-4244-0757-5
  • Electronic_ISBN
    1-4244-0757-5
  • Type

    conf

  • DOI
    10.1109/ICICDT.2007.4299578
  • Filename
    4299578