DocumentCode :
3364055
Title :
Room temperature observation of lateral quantization effects in modulated barrier InGaAs/InP wires
Author :
Kerkel, K. ; Oshinowo, J. ; Forchel, A. ; Weber, J. ; Zielinski, E.
Author_Institution :
Dept. of Tech. Phys., Wurzburg Univ., Germany
fYear :
1996
fDate :
21-25 Apr 1996
Firstpage :
31
Lastpage :
34
Abstract :
We have fabricated buried InGaAs/InP quantum wires with widths down to 15 nm by high resolution electron beam lithography and selective wet chemical etching. In our approach, only the InP cap layer of an InGaAs/InP quantum well is locally removed. In the etched parts of the sample, InGaAs surface quantum wells are formed, where the conduction and valence band discontinuity between InGaAs and InP (600 meV) is replaced by the high vacuum barrier (~5 eV). Therefore the quantization energies are enlarged in the InGaAs surface quantum wells. This creates a lateral potential, that confines the carriers to the InP covered regions, which act as wires. The different thermal stability of both regions is used to enhance the lateral potential significantly in a subsequent rapid thermal annealing step. The wires show clear lateral quantization effects with energy shifts up to 13 meV and high luminescence intensities up to room temperature
Keywords :
III-V semiconductors; buried layers; conduction bands; electron beam lithography; etching; gallium arsenide; indium compounds; interface states; photoluminescence; rapid thermal annealing; semiconductor quantum wells; semiconductor quantum wires; surface potential; thermal stability; valence bands; 15 nm; InGaAs surface quantum wells; InGaAs-InP; InGaAs/InP quantum well; InP cap layer; buried InGaAs/InP quantum wires; conduction band discontinuity; energy shifts; high luminescence intensities; high resolution electron beam lithography; high vacuum barrier; lateral potential; lateral quantization effects; modulated barrier InGaAs/InP wires; quantization energies; rapid thermal annealing; room temperature; room temperature observation; selective wet chemical etching; thermal stability; valence band discontinuity; Chemicals; Electron beams; Elementary particle vacuum; Indium gallium arsenide; Indium phosphide; Lithography; Quantization; Temperature; Wet etching; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
Type :
conf
DOI :
10.1109/ICIPRM.1996.491926
Filename :
491926
Link To Document :
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