• DocumentCode
    3364194
  • Title

    Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading

  • Author

    Prume, Klaus ; Waser, Rainer

  • Author_Institution
    Inst. fiir Werkstoffe der Elektrotechnik, Rheinisch-Westfalische Tech. Hochschule, Aachen, Germany
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    675
  • Abstract
    Simulation methods are more and more employed to investigate characteristics and behavior of complex electronic devices. The results can be used to obtain reliability data and reasons for failures and to investigate possibilities for device optimizations. One challenge in these simulations is the consideration of coupled and nonlinear material characteristics, e.g. the piezoelectric coupling in BaTiO3 based capacitor materials. In our work we present the modeling of the nonlinear coupled behavior of a ceramic multilayer capacitor (MLC) as model for other multilayer structures under transient large signal operating conditions. The electrical, mechanical, and thermal stress distribution are identified for the highest occurring voltage when the MLC is used as a bypass capacitor in an under damped circuit
  • Keywords
    barium compounds; ceramic capacitors; ferroelectric capacitors; finite element analysis; piezoceramics; reliability; BaTiO3; BaTiO3 based capacitor materials; MLC; bypass capacitor; ceramic multilayer capacitors; coupled characteristics; coupled material characteristics; device optimizations; failures; finite-element simulation; modeling; nonlinear material characteristics; piezoelectric coupling; reliability data; thermal stress distribution; transient electrical loading; transient large signal operating conditions; under damped circuit; Capacitors; Ceramics; Couplings; Dielectric materials; Finite element methods; Inductance; Integrated circuit modeling; Nonhomogeneous media; Polarization; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.942410
  • Filename
    942410