Title :
An analysis of the contribution of scale in mammographic mass classification
Author :
Bruce, Lori M. ; Kalluri, Ravikiran
Author_Institution :
Dept. of Electr. & Comput. Eng., Nevada Univ., Las Vegas, NV, USA
fDate :
30 Oct-2 Nov 1997
Abstract :
Mammographic masses are often classified according to their shape as round, nodular or stellate. These classifications are useful in the recognition of benign vs. malignant masses. In this preliminary study, a set of 30 mammograms are analyzed. The 2D shape contour of each mass is mapped to a 1D radial distance measure. The discrete wavelet transform is applied to each measure in which a full decomposition is computed. The root-mean-square of the coefficients in each scale is then computed. These values are used as input features in a statistical classification system. The discriminating powers of these features are analyzed via linear discriminant analysis. The classification system utilizes a conventional Euclidean distance measure to determine class membership. The classification rates are 87%, 93% and 80% when using Haar, Daubechies-3 and Daubechies-5 wavelets, respectively
Keywords :
discrete wavelet transforms; feature extraction; image classification; mammography; medical image processing; tumours; 1D radial distance measure; 2D shape contour; Daubechies-3 wavelets; Daubechies-5 wavelets; Euclidean distance measure; Haar wavelets; benign masses; class membership; classification rate; coefficient root-mean-square; decomposition; discrete wavelet transform; discriminating power; input features; linear discriminant analysis; malignant masses; mammographic mass classification; nodular masses; pattern recognition; round masses; scale; statistical classification system; stellate masses; Cancer; Discrete wavelet transforms; Electronic mail; Equations; Euclidean distance; Linear discriminant analysis; Mammography; Pattern recognition; Shape measurement; Wavelet analysis;
Conference_Titel :
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-4262-3
DOI :
10.1109/IEMBS.1997.757023