DocumentCode
3364284
Title
Visual tracking of multiple interacting objects through Rao-Blackwellized Data Association Particle Filtering
Author
Del Blanco, Carlos R. ; Jaureguizar, Fernando ; García, Narciso
Author_Institution
Grupo de Tratamiento de Imagenes, Univ. Politec. de Madrid, Madrid, Spain
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
821
Lastpage
824
Abstract
A multiple object visual tracking framework is presented, which is able to manage complex object interactions, missing detections and clutter. The main contribution is the ability to deal with complex situations in which the interacting objects can change their dynamics while they are occluded. This is achieved by explicitly estimating putative locations of the occluded objects. The tracking is modeled by a Rao-Blackwellized Data Association Particle Filter (RBDAPF), which has a tractable substructure that allows to analytically compute the object positions, while the object-measurement associations are approximated by Particle Filtering. Besides improving the accuracy, this filter decomposition reduces the computational cost, since the complexity with the number of objects becomes linear instead of exponential. The Particle Filter efficiently manages the measurements from visible and occluded objects, the clutter, and missing measurements to estimate the correct data associations that lead to a robust tracking. Experimental results on surveillance videos show that the proposed RBDAPF framework is able to track multiple interacting objects in complex situations.
Keywords
object detection; particle filtering (numerical methods); sensor fusion; RBDAPF; Rao-blackwellized data association; multiple object visual tracking framework; object-measurement association; particle filtering; Atmospheric measurements; Clutter; Detectors; Particle filters; Particle measurements; Position measurement; Radar tracking; Multi-object tracking; Rao-Blackwellization; data association; interactions; occlusions;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5653411
Filename
5653411
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