Title :
Abnormal stretch reflex mechanics in spastic spinal cord injured subjects
Author :
Mirbagheri, M.M. ; Kearney, R.E. ; Barbeau, H. ; Ladouceur, M.
Author_Institution :
Dept. of Biomed. Eng., McGill Univ., Montreal, Que., Canada
fDate :
30 Oct-2 Nov 1997
Abstract :
A parallel-cascade system identification method was used to identify the modulation of reflex contributions to dynamic ankle stiffness with position stimuli amplitude and frequency in both normal and spastic spinal cord injured (SCI) subjects. As amplitude increased, reflex stiffness first increased and then decreased in both normal and SCI subjects. Reflex gain was significantly higher in patients than in normal subjects at all conditions. The reflex threshold, the minimum amplitude required to elicit a stretch reflex response, was smaller in SCI than in normal subjects. As frequency increased, reflex stiffness decreased in both normal and SCI subjects; however, it was significantly higher in SCI than in normal subjects at all frequencies. These results demonstrate that the reflex mechanics are abnormal in SCI spastic patients due to both an increase in reflex gain and a decrease in reflex threshold
Keywords :
biomechanics; electromyography; identification; least squares approximations; muscle; neurophysiology; physiological models; torque; transient response; EMG; abnormal muscle tone; abnormal stretch reflex mechanics; dynamic ankle stiffness; impulse response functions; intrinsic torque; nonlinear least squares; parallel-cascade system identification; parametric model; perturbation frequency; position stimuli amplitude; position stimuli frequency; pseudorandom binary sequences; reflex gain; reflex stiffness; reflex threshold; spastic spinal cord injured subjects; third order system; Amplitude modulation; Biomedical engineering; Frequency; Medical treatment; Muscles; Parametric statistics; Pathology; Spinal cord; System identification; Torque;
Conference_Titel :
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-4262-3
DOI :
10.1109/IEMBS.1997.757034