DocumentCode :
3364380
Title :
Piezoelectric properties of KNbO/sub 3/ crystals for extensional modes
Author :
Nakamura, Kiyoshi ; Tokiwa, Tsuyoshi ; Kawamura, Yoshiko
Author_Institution :
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
Volume :
2
fYear :
2000
fDate :
July 21 2000-Aug. 2 2000
Firstpage :
717
Abstract :
The theoretical calculation of orientation dependence of the electromechanical coupling factor for the thickness extensional mode, k1, in KNbO3 crystal has shown that it is as high as 69% for the 49.5° rotated X-cut about the Y-axis, which is the highest among known piezoelectricS. To experimentally confirm this, the immpedence responses of the thickness-extensional mode vibrators are measured and the related constants are evaluated. The measured coupling factor is as high as 70%. The strain vs electric-field behaviors of the pseudocubic (001) cut, which is close to the 49.5° rotated X-cut, are measured. The strain vs electric field curves exhibit large hysteresis in a high electric field range for as-cut single domain crystals, whereas for etched single domain crystals they exhibit good linearity even in the high electric field range. Similar experiments are performed for multidomain (001) cut crystals poled along the <001> direction and the results are cornjmed with those of single domain crystals. Based on the results, a possibility that the enhanced piemelectric properties in engineered domain structures of KNb03, PZN-PT, and BaTiO3 are mainly due to the orientation dependence of d33 is suggested.
Keywords :
crystal resonators; electric domains; etching; piezoelectric transducers; potassium compounds; ultrasonic transducers; KNbO/sub 3/; as-cut single domain crystals; coupling factor; electromechanical coupling factor; etched single domain crystals; hysteresis; impedance responses; multi-domain cut crystals; orientation dependence; piezoelectric properties; piezoelectric resonant devices; rotated X-cut; thickness-extensional mode; thickness-extensional mode vibrators; ultrasonic transducers; Capacitive sensors; Crystals; Electric variables measurement; Etching; Hysteresis; Impedance measurement; Rotation measurement; Strain measurement; Thickness measurement; Vibration measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI, USA
ISSN :
1099-4734
Print_ISBN :
0-7803-5940-2
Type :
conf
DOI :
10.1109/ISAF.2000.942420
Filename :
942420
Link To Document :
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