• DocumentCode
    3364561
  • Title

    Leaf Area Index retrieval from remotely sensed data: Scaling effect and propagation mechanisms

  • Author

    Wu, Hua ; Tang, Bo-Hui ; Li, Chuanrong ; Li, Zhao-Liang

  • Author_Institution
    State Key Lab. of Resources & Environ. Inf. Syst., CAS, Beijing, China
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    2668
  • Lastpage
    2671
  • Abstract
    This paper makes an attempt to address the scaling problem of Leaf Area Index (LAI) and to analyze the propagation of scaling effect of LAI. On the basis of the Taylor series expansion and following the general scaling procedure, it is demonstrated that the magnitude of the scaling effect is the product of the degree of the non-linearity of the retrieval model and the spatial heterogeneity of input variables involved in this model. Finally, a scaling correction model is proposed to correct for the scaling effect of LAI. The validation using the simulated data indicates that the proposed scaling correction model of LAI gives promising accuracy if the spatial heterogeneity is well characterized by its wavelet variance. The RMSE and relative error of retrieved LAI induced by the scale effect can be greatly reduced after scaling correction. The scaling propagation analysis of LAI reveals that the scaling effects caused by several non-linear components may compensate for each other, which would enhance our confidence in using LAI product over heterogeneity areas.
  • Keywords
    remote sensing; scaling phenomena; vegetation; LAI retrieval; Leaf Area Index retrieval; Taylor series expansion; relative error; remote sensing; scaling correction model; scaling effect; scaling propagation mechanism; Analytical models; Biological system modeling; Data models; Estimation; Indexes; Pixel; Remote sensing; Leaf area index; Model non-linearity; Scaling; Scaling effect; Spatial heterogeneity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5653438
  • Filename
    5653438