• DocumentCode
    336459
  • Title

    The effects of long term FES-assisted walking on intrinsic and reflex dynamic stiffness in spinal cord injured patients

  • Author

    Mirbagheri, M.M. ; Ladouceur, M. ; Kearney, R.E. ; Barbeau, H.

  • Author_Institution
    Dept. of Biomed. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    4
  • fYear
    1997
  • fDate
    30 Oct-2 Nov 1997
  • Firstpage
    1768
  • Abstract
    The effects of long term Functional Electrical Stimulation (FES) assisted walking on ankle dynamic stiffness were examined in spinal cord injured persons with incomplete motor function loss (SCI-IMFL). A parallel-cascade system identification method was used to identify intrinsic and reflex contributions to dynamic ankle stiffness at different positions in both normal and SCI-IMFL subjects. Intrasubject reliability of the method was high, indicating that the method can be used to track changes in ankle mechanics with time. Subjects were evaluated before and after using FES-assisted walking for a period of at least 18 months. The results demonstrate that ankle stiffness decreased with long term FES assisted walking because of a decrease in both intrinsic and reflex stiffness
  • Keywords
    biocontrol; biomechanics; identification; neuromuscular stimulation; orthotics; patient rehabilitation; functional electrical stimulation; incomplete motor function loss; intrasubject reliability; intrinsic dynamic stiffness; long term FES-assisted walking; nonlinear least squares; orthotic system; parallel-cascade system identification; parametric model; reflex dynamic stiffness; rehabilitation; spinal cord injured patients; Biomedical engineering; Legged locomotion; Medical treatment; Neuromuscular stimulation; Nonlinear dynamical systems; Parametric statistics; Protocols; Spinal cord; System identification; Torque;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-4262-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.1997.757068
  • Filename
    757068