Title :
CMOS Power Amplifier with ESD Protection Design Merged in Matching Network
Author :
Shiu, Yu-Da ; Huang, Bo-Shih ; Ker, Ming-Dou
Author_Institution :
Ind. Technol. Res. Inst., Hsinchu
Abstract :
A power amplifier (PA) with combination of ESD protection circuit and matching network into single block was proposed and implemented in a 0.18-¿m CMOS process. By comprising ESD protection function into the matching network, this design omits individual I/O ESD clamps to alleviate loading that degrades RF performances. According to the experimental results, the ESD protection circuit with LC configuration contributes a 3.0-kV human body model (HBM) ESD robustness without significant degradation on RF performances of the PA for 2.4-GHz RF applications.
Keywords :
CMOS integrated circuits; UHF power amplifiers; electrostatic discharge; integrated circuit design; overvoltage protection; CMOS power amplifier; ESD protection circuit; circuit design; human body model; matching network; CMOS process; Circuits; Clamps; Degradation; Electrostatic discharge; Humans; Power amplifiers; Protection; Radio frequency; Radiofrequency amplifiers;
Conference_Titel :
Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-1377-5
Electronic_ISBN :
978-1-4244-1378-2
DOI :
10.1109/ICECS.2007.4511118