Title :
New Switch Box Architecture for SEU Detection in SRAM-Based FPGAs
Author :
Rohani, Alireza ; Zarandi, Hamid R. ; Zandrahimi, Mahroo
Keywords :
Boolean functions; Circuit faults; Delay; Energy consumption; Event detection; Fault detection; Field programmable gate arrays; Paper technology; Single event upset; Switches;
Conference_Titel :
Computer Science and its Applications, 2009. CSA '09. 2nd International Conference on
Conference_Location :
Jeju, Korea (South)
Print_ISBN :
978-1-4244-4945-3
DOI :
10.1109/CSA.2009.5404269
