DocumentCode
3364758
Title
Total Ionizing Dose Effects in Switched-Capacitor Filters using Oscillation-Based Test
Author
Espinosa-Duran, John M. ; Velasco-Medina, Jaime ; Huertas, Gloria ; Huertas, Jose L.
Author_Institution
Univ. del Valle, Cali
fYear
2007
fDate
11-14 Dec. 2007
Firstpage
841
Lastpage
844
Abstract
This paper studies long-term effects produced by ionizing radiation in a switched-capacitor filter, using the Oscillation Based Test (OBT) approach [1]. In this case, threshold voltage shifting is considered as one of the major concerning effects produced by Total Ionizing Dose (TID). Simulation results show that the OBT approach is very well suited for detection of faulty filters.
Keywords
radiation hardening (electronics); switched capacitor filters; ionizing radiation; oscillation-based test; switched-capacitor filter; threshold voltage shifting; total ionizing dose effect; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Filters; Ionizing radiation; Threshold voltage; Oscillation Based Test (OBT); Radiation Effects; Switched-Capacitor Circuits; Total Ionizing Dose (TID);
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on
Conference_Location
Marrakech
Print_ISBN
978-1-4244-1377-5
Electronic_ISBN
978-1-4244-1378-2
Type
conf
DOI
10.1109/ICECS.2007.4511122
Filename
4511122
Link To Document