DocumentCode :
3364845
Title :
Electron irradiation effects in electrostrictive P(VDF-TrFE) copolymers
Author :
Tang, Y.W. ; Zhao, X.-Z. ; Chan, Helen L.W. ; Choy, C.L.
Author_Institution :
Dept. of Phys., Wuhan Univ., China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
793
Abstract :
Electrical field-induced strain response of electron-irradiated Poly(vinylidene fluoride trifluoroethylene) copolymer has been studied by a Mach-Zehnder type Heterodyne interferometer in the frequency range of 3 to 9 kHz. The electrostrictive constant is calculated from the strain results, which is of the same order of magnitude as those obtained at 1 Hz by a bimorph-based strain sensor, but at much lower electrical field. Changes in the piezoelectric coefficient, dielectric property and phase transition behavior of the same copolymer have been studied. The structural changes in the irradiated films were probed by means of differential scanning calorimetry, X-ray diffraction and IR spectra. The reversible solid-state transition between the polar and non-polar phase in the crystalline regions of the copolymer driven by the external electric field is suggested to be responsible for the significant high electrostrictive strain of the electron-irradiated copolymer
Keywords :
Mach-Zehnder interferometers; X-ray diffraction; differential scanning calorimetry; electron beam effects; electrostriction; infrared spectra; piezoelectric materials; polymer blends; polymer films; solid-state phase transformations; 1 Hz; 3 to 9 kHz; IR spectra; Mach-Zehnder heterodyne interferometer; P(VDF-TrFE) copolymer film; X-ray diffraction; bimorph strain sensor; dielectric properties; differential scanning calorimetry; electron irradiation; electrostrictive constant; phase transition; piezoelectric coefficient; Calorimetry; Capacitive sensors; Dielectrics; Electrons; Electrostriction; Frequency; Infrared spectra; Piezoelectric films; Solid state circuits; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
ISSN :
1099-4734
Print_ISBN :
0-7803-5940-2
Type :
conf
DOI :
10.1109/ISAF.2000.942438
Filename :
942438
Link To Document :
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