• DocumentCode
    3364845
  • Title

    Electron irradiation effects in electrostrictive P(VDF-TrFE) copolymers

  • Author

    Tang, Y.W. ; Zhao, X.-Z. ; Chan, Helen L.W. ; Choy, C.L.

  • Author_Institution
    Dept. of Phys., Wuhan Univ., China
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    793
  • Abstract
    Electrical field-induced strain response of electron-irradiated Poly(vinylidene fluoride trifluoroethylene) copolymer has been studied by a Mach-Zehnder type Heterodyne interferometer in the frequency range of 3 to 9 kHz. The electrostrictive constant is calculated from the strain results, which is of the same order of magnitude as those obtained at 1 Hz by a bimorph-based strain sensor, but at much lower electrical field. Changes in the piezoelectric coefficient, dielectric property and phase transition behavior of the same copolymer have been studied. The structural changes in the irradiated films were probed by means of differential scanning calorimetry, X-ray diffraction and IR spectra. The reversible solid-state transition between the polar and non-polar phase in the crystalline regions of the copolymer driven by the external electric field is suggested to be responsible for the significant high electrostrictive strain of the electron-irradiated copolymer
  • Keywords
    Mach-Zehnder interferometers; X-ray diffraction; differential scanning calorimetry; electron beam effects; electrostriction; infrared spectra; piezoelectric materials; polymer blends; polymer films; solid-state phase transformations; 1 Hz; 3 to 9 kHz; IR spectra; Mach-Zehnder heterodyne interferometer; P(VDF-TrFE) copolymer film; X-ray diffraction; bimorph strain sensor; dielectric properties; differential scanning calorimetry; electron irradiation; electrostrictive constant; phase transition; piezoelectric coefficient; Calorimetry; Capacitive sensors; Dielectrics; Electrons; Electrostriction; Frequency; Infrared spectra; Piezoelectric films; Solid state circuits; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.942438
  • Filename
    942438