Title :
Theoretical analysis of word-level switching activity in the presence of glitching and correlation
Author :
Satyanarayana, Janardhan H. ; Parhi, Keshab K.
Author_Institution :
Lucent Technol., AT&T Bell Labs., Holmdel, NJ, USA
Abstract :
This paper presents a novel analytical approach to complete the switching activity in digital circuits at the word-level in the presence of glitching and correlation. The proposed approach makes use of signal statistics such as mean, variance, and autocorrelation. A novel expression is derived for the switching activity αf at the output node f of an arbitrary circuit in terms of time-slot autocorrelation coefficient, the expected value, and the signal probability. The switching activity analysis of a signal at the word-level is computed by summing the activities of all the individual bits constituting the signal. A novel relationship between the correlation coefficient of the higher order bits of a normally distributed signal and the bit where the correlation begins is also presented. The proposed approach can estimate the switching activity in less than a second which is orders of magnitude faster than simulation based approaches. Simulation results show that Me errors using the proposed approach are about 6% on an average and that the approach is well suited even for highly correlated speech and music signals
Keywords :
CMOS digital integrated circuits; circuit simulation; correlation methods; digital signal processing chips; integrated circuit design; probability; DSP chips; digital CMOS circuits; glitching; higher order bits; normally distributed signal; output node; signal probability; signal statistics; simulation based approaches; switching activity; time-slot autocorrelation coefficient; word-level switching activity; Autocorrelation; Capacitance; Circuit simulation; Clocks; Energy consumption; Multiple signal classification; Probability; Signal analysis; Statistics; Switching circuits;
Conference_Titel :
VLSI, 1999. Proceedings. Ninth Great Lakes Symposium on
Conference_Location :
Ypsilanti, MI
Print_ISBN :
0-7695-0104-4
DOI :
10.1109/GLSV.1999.757374