Title :
Analysis of MCCT´s turn-on and short circuit operation
Author :
Iwaana, Tadayoshi ; Iwamuro, Noriyuki ; Harada, Yuichi ; Onozawa, Yuichi ; Seki, Yasukazu
Author_Institution :
Fuji Electr. Corp. Res. & Dev. Ltd., Matsumoto, Japan
Abstract :
The turn-on characteristic and oscillation waveform in the short circuit test of a 1200 V MOS controlled cascode thyristor (MCCT) are described for the first time. A smaller turn-on loss can be successfully achieved in the MCCT than that of an IGBT which was fabricated using the same epitaxial wafer with the MCCT. In the MCCT, the oscillation waveform in the short circuit test takes place for the whole duration. However, a smaller optimized gate capacitance successfully achieves elimination of the oscillation without degradation of the electrical characteristics
Keywords :
MOS-controlled thyristors; capacitance; losses; oscillations; semiconductor device testing; transient analysis; 1200 V; IGBT; MCCT short circuit operation; MCCT turn-on; MOS controlled cascode thyristor; electrical characteristics; epitaxial wafer; optimized gate capacitance; oscillation elimination; oscillation waveform; short circuit test; turn-on characteristic; turn-on loss; Anodes; Cathodes; Circuit testing; Insulated gate bipolar transistors; Laboratories; Low voltage; MOSFET circuits; Threshold voltage; Thyristors; Voltage control;
Conference_Titel :
Power Semiconductor Devices and ICs, 1998. ISPSD 98. Proceedings of the 10th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-4752-8
DOI :
10.1109/ISPSD.1998.702660
