DocumentCode :
3365002
Title :
The Use of Simulated Annealing with Fuzzy Objective Function to Optimal Frequency Selection for Analog Circuit Diagnosis
Author :
Grzechca, Damian ; Golonek, Tomasz ; Rutkowski, Jerzy
Author_Institution :
Silesian Univ. of Technol., Gliwice
fYear :
2007
fDate :
11-14 Dec. 2007
Firstpage :
899
Lastpage :
902
Abstract :
Presented work focuses on detecting a single hard fault in analog electronic circuit in AC domain. The combined approach to analog circuit fault test frequency selection is proposed. Reduction of a fault dictionary size is the main goal of the method. It is achieved by the use of heuristic algorithm and modified fitness function. Simulated annealing as a search engine and fuzzy system as a fitness function is applied. During the search process the fault detection rate of a CUT must remain at the same level (obligatory condition) while localization should stay unchanged (both with respect to the use of all frequencies). The input sources frequencies should separate all possible (assumed) circuit states. Proposed approach is verified on the example and compare with pure simulated annealing algorithm (weighted function).
Keywords :
analogue circuits; circuit reliability; fault diagnosis; fuzzy set theory; analog circuit diagnosis; circuit fault; electronic circuit; fault detection rate; fuzzy objective function; fuzzy system; heuristic algorithm; modified fitness function; optimal frequency selection; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Electrical fault detection; Electronic circuits; Fault detection; Frequency; Simulated annealing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-1377-5
Electronic_ISBN :
978-1-4244-1378-2
Type :
conf
DOI :
10.1109/ICECS.2007.4511136
Filename :
4511136
Link To Document :
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