Title :
High-frequency electronic package and interconnection effects
Author :
Cherry, P.C. ; Iskander, M.F.
Author_Institution :
Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA
Abstract :
With data rates of future devices going beyond 10 gigabit/sec (Gb/s), it is essential that electrical parasitic effects must be taken into account early on in the design stage. This paper addresses the electrical issues of package design including propagation and parasitic effects of package structures. Using the finite-difference time-domain method as a high-frequency, full wave analysis mechanism various package types and parasitic effects of package structures are analyzed. These include package structures such as microstrip, conductor and non-conductor backed coplanar waveguides and vias. Benefits of flip-chip mounting, and packaging effects such as bond wires (single and multiple bond wires in parallel) and coupling between lines are examined using the developed FDTD code. Equivalent RLC circuit models for some of the analyzed structures are also presented.
Keywords :
coplanar waveguides; equivalent circuits; finite difference time-domain analysis; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; microstrip lines; microwave integrated circuits; 10 Gbit/s; FDTD code; bond wires; conductor backed coplanar waveguides; data rates; electrical issues; electrical parasitic effects; electronic components; equivalent RLC circuit models; finite-difference time-domain method; flip-chip mounting; full wave analysis; high performance electronic devices; high-frequency electronic package; interconnection effects; lines coupling; microstrip; non-conductor backed coplanar waveguides; package design; package structures; parasitic effects; propagation effects; vias; Bonding; Conductors; Coplanar waveguides; Coupling circuits; Electronics packaging; Finite difference methods; Integrated circuit interconnections; Microstrip; Time domain analysis; Wires;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-2009-3
DOI :
10.1109/APS.1994.408121