DocumentCode :
3365230
Title :
Anodic bonding technology of slender glass tube and silicon in pressure sensor packaging
Author :
Tao Chen ; Lining Sun ; Mingqiang Pan ; Yangjun Wang ; Jizhu Liu ; Liguo Chen
Author_Institution :
Robot. & Microsyst. Center, Soochow Univ., Suzhou, China
fYear :
2013
fDate :
11-13 Dec. 2013
Firstpage :
813
Lastpage :
816
Abstract :
Anodic bonding technology of semiconductor silicon and glass is a key technology of micro electronic mechanical system (MEMS). Because of large bonding strength and simple process, silicon-glass anodic bonding is popular in piezoresistive pressure sensor. In order to improve sensors performance, the glass tube is designed to be elongated and slender. However, the special design brings difficulty for anodic bonding. The traditional bonding way is unavailable and bonding failure rate increases dramatically. In this paper, the bonding process of slender glass tube and silicon is present, and a novel bonding device is designed based on the silicon-glass bonding process. The results show that the bonding is the best when the cantilever elastic deformation is less than 0.5 mm interface temperature loaded from the silicon is 415°C and the voltage 1200 V is loaded from the position H=2 mm.
Keywords :
cantilevers; elastic deformation; electronics packaging; elemental semiconductors; glass; microsensors; pressure sensors; silicon; MEMS; bonding failure rate; bonding strength; cantilever elastic deformation; microelectronicmechanical system; piezoresistive pressure sensor; pressure sensor packaging; silicon-glass anodic bonding; slender glass tube; temperature 415 degC; voltage 1200 V; Bonding; Electron tubes; Glass; Heating; Shape; Silicon; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-2832-3
Type :
conf
DOI :
10.1109/EPTC.2013.6745834
Filename :
6745834
Link To Document :
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