DocumentCode :
3365320
Title :
Study of top paddle delamination on Cu leadframe
Author :
Tee Swee Xian ; Koh Feng Choon
Author_Institution :
Infineon Technol. (Adv. Logic) Sdn. Bhd., Batu Berendam, Malaysia
fYear :
2013
fDate :
11-13 Dec. 2013
Firstpage :
827
Lastpage :
830
Abstract :
The most influence factor of delamination between copper alloy leadframe and epoxy mold compound interface is the finishing leadframe surfaces. Based on leadframe manufacturing process, anti-tarnish is applied by dipping entire leadframe into a solution at the end of plating process. The anti tarnish will cover the surfaces of the die bond and wire bond pads, regardless of different types of metal plating, as well as exposed copper in the unplated areas. This paper will discuss the effect of anti tarnish on the top paddle delamination formation in copper leadframe packages. Leadframe from different supplier, grades of anti tarnish and plasma process control had been deliberated. Surfaces analysis techniques XPS and Tofsims were used to characterize and understand the chemistry of the leadframe surfaces. Furthermore, contact angle measurement was applied to analyse the material surfaces properties such as wettability, surface energy and adhesion. As a result, it has an indication of higher concentration of benzotrizole or its derivatives (BTA) from the anti tarnish coating significantly influence the top paddle delamination and Ar plasma process were employed to remove the anti tarnish layer on the Cu leadframe and consequently eliminate the top paddle delamination.
Keywords :
X-ray photoelectron spectra; argon; contact angle; copper alloys; delamination; electronics packaging; lead bonding; secondary ion mass spectroscopy; surface energy; Ar; Ar plasma process; Cu; TOFSIMS; XPS; adhesion; anti tarnish coating; benzotrizole; contact angle measurement; copper alloy leadframe; copper leadframe packages; die bond pads; epoxy mold compound interface; leadframe manufacturing process; material surfaces properties; metal plating; plasma process control; plating process; surface energy; surfaces analysis techniques; top paddle delamination; wettability; wire bond pads; Adhesives; Cleaning; Delamination; Lead; Materials; Plasmas; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-2832-3
Type :
conf
DOI :
10.1109/EPTC.2013.6745837
Filename :
6745837
Link To Document :
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