• DocumentCode
    3365320
  • Title

    Study of top paddle delamination on Cu leadframe

  • Author

    Tee Swee Xian ; Koh Feng Choon

  • Author_Institution
    Infineon Technol. (Adv. Logic) Sdn. Bhd., Batu Berendam, Malaysia
  • fYear
    2013
  • fDate
    11-13 Dec. 2013
  • Firstpage
    827
  • Lastpage
    830
  • Abstract
    The most influence factor of delamination between copper alloy leadframe and epoxy mold compound interface is the finishing leadframe surfaces. Based on leadframe manufacturing process, anti-tarnish is applied by dipping entire leadframe into a solution at the end of plating process. The anti tarnish will cover the surfaces of the die bond and wire bond pads, regardless of different types of metal plating, as well as exposed copper in the unplated areas. This paper will discuss the effect of anti tarnish on the top paddle delamination formation in copper leadframe packages. Leadframe from different supplier, grades of anti tarnish and plasma process control had been deliberated. Surfaces analysis techniques XPS and Tofsims were used to characterize and understand the chemistry of the leadframe surfaces. Furthermore, contact angle measurement was applied to analyse the material surfaces properties such as wettability, surface energy and adhesion. As a result, it has an indication of higher concentration of benzotrizole or its derivatives (BTA) from the anti tarnish coating significantly influence the top paddle delamination and Ar plasma process were employed to remove the anti tarnish layer on the Cu leadframe and consequently eliminate the top paddle delamination.
  • Keywords
    X-ray photoelectron spectra; argon; contact angle; copper alloys; delamination; electronics packaging; lead bonding; secondary ion mass spectroscopy; surface energy; Ar; Ar plasma process; Cu; TOFSIMS; XPS; adhesion; anti tarnish coating; benzotrizole; contact angle measurement; copper alloy leadframe; copper leadframe packages; die bond pads; epoxy mold compound interface; leadframe manufacturing process; material surfaces properties; metal plating; plasma process control; plating process; surface energy; surfaces analysis techniques; top paddle delamination; wettability; wire bond pads; Adhesives; Cleaning; Delamination; Lead; Materials; Plasmas; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-2832-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2013.6745837
  • Filename
    6745837